Examination of cerebral electrical admittance plethysmogram in healthy newborns
ZHOU Ke-Ying, SONG Jin-Zhi, LI Jing-Zhi, LUO Hui, XIAO Xue-Chang, LI Zhi-Guang, WU Ben-Qing
Department of Pediatrics, Second Affiliated Hospital of Jinan University Medical College, Shenzhen, Guangdong 518020, China. keyingzhou@163.com
Abstract OBJECTIVE: Cerebral electrical admittance plethysmography is a novel noninvasive technique for evaluating cerebral hemodynamics. This study aimed to measure the reference values of cerebral electrical admittance plethysmogram in healthy newborns. METHODS: Bilateral cerebral electrical admittance plethysmography was performed in 40 healthy newborns. RESULTS: The values of various indexes of cerebral electrical admittance plethysmogram in 40 newborns were obtained by this technique. The index of Admittance Differential Loop (ADL) I+II at the third and fourth days after birth was significantly higher than that at the first day of life (P<0.05). There were significant differences in the index of ADL I+II and the ratio of Hs to b-S (Hs/ b-S) among different birth weight groups (P<0.05). No significant differences were found in all the indexes of cerebral electrical admittance plethysmogram between the left and right brain of newborns. Gender and parturition mode had also no effects on these indexes. CONCLUSIONS: The research reported the reference values of cerebral electrical admittance plethysmogram in healthy newborns. The postnatal age and birth weight are influencing factors for the cerebral electrical admittance plethysmogram.
Key words ：
Cerebrovascular circulation
Cerebral electrical admittance plethysmogram
Neonate
Cite this article:
ZHOU Ke-Ying,SONG Jin-Zhi,LI Jing-Zhi et al. Examination of cerebral electrical admittance plethysmogram in healthy newborns[J]. 中国当代儿科杂志, 2006, 8(6): 447-449.
ZHOU Ke-Ying,SONG Jin-Zhi,LI Jing-Zhi et al. Examination of cerebral electrical admittance plethysmogram in healthy newborns[J]. CJCP, 2006, 8(6): 447-449.
URL:
http://www.zgddek.com/EN/ OR http://www.zgddek.com/EN/Y2006/V8/I6/447
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