儿童睡眠中癫癎性电持续状态的相关因素分析

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摘要目的：儿童睡眠中癫癎性电持续状态（ESES）的病因不明，该研究旨在分析ESES的相关因素，为有效预防和治疗此病提供依据。方法：以唐山市妇幼保健院2000年1月至2006年7月确诊为ESES的30例患儿为研究对象，选择与ESES组相匹配的非ESES癫癎组30例为对照组，设计问卷调查表获取资料。对癫癎发作类型、癫癎样放电起源部位、家族史及围生期情况、影像学、智商、癫癎综合征等多项因素采用χ2检验及t检验进行分析。结果：ESES组与对照组在癫癎家族史、智力低下及癫癎综合征、语言障碍之间比较差异有显著性（P<0.05）。癫癎发作类型、癫癎样放电起源部位、父母育龄、患儿出生史、热性惊厥家族史、影像学异常两组间差异均无显著性意义（P＞0.05）。既往患热性惊厥、脑瘫、颅内感染两组间比较，差异亦无显著性意义（P＞0.05）。结论：ESES与癫癎家族史、癫癎综合征、智力水平及语言障碍相关。［中国当代儿科杂志，2009，11（2）：110-112］

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关键词 ：睡眠中癫癎性电持续状态, 相关因素, 儿童

Abstract：OBJECTIVE: The pathogenesis of electrical status epilepticus during sleep (ESES) in children remains unknown. We undertook a retrospective study of epileptic children who presented with ESES to investigate the correlation factors of ESES. METHODS: Thirty epileptic children with ESES (ESES group) and 30 age-and sex-matched epileptic children without ESES (control group) admitted to Maternal and Child Health Care Hospital of Tangshan between January 2000 and July 2006 were enrolled. The results of questionnaire and laboratory examinations were compared between the two groups. RESULTS: Nine patients had a family history of epilepsy in the ESES group, but only 2 patients in the control group (P<0.05). Language disorder was found in 11 patients in the ESES group, but only 2 patients in the control group (P<0.05). Thirteen patients were confirmed with epileptic syndrome in the ESES group, but only 5 patients in the control group (P<0.05). Twentyfive patients in the ESES group showed mental retardation, but only 5 patients from the control group (P<0.01). CONCLUSIONS: ESES may be correlated with family history of epilepsy, epileptic syndrome, mental retardation and language disorder.［Chin J Contemp Pediatr, 2009, 11 (2):110-112］

Key words： Electrical status epilepticus during sleep Correlation factor Child

PACS:

R742.1

引用本文:

张双,庞保东,曹丽华等. 儿童睡眠中癫癎性电持续状态的相关因素分析[J]. 中国当代儿科杂志, 2009, 11(02): 110-112.

ZHANG Shuang,PANG Bao-Dong,CAO Li-Hua et al. Correlation factors of electrical status epilepticus during sleep in children[J]. CJCP, 2009, 11(02): 110-112.

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http://www.zgddek.com/CN/ 或 http://www.zgddek.com/CN/Y2009/V11/I02/110

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